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Ultramicroscopy. 2010 Mar;110(4):325-9. doi: 10.1016/j.ultramic.2010.01.004. Epub 2010 Jan 21.

Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics.

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  • 1Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.


A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics.

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