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Opt Lett. 1996 Oct 15;21(20):1682-4.

Ultrafast dark-field interferometric microscopic reflectometry.

Abstract

A new method of ultrafast dark-field correlation interferometry from reflective microscopic objects is described. A 120-fs single-shot registration is achieved with a dynamic range of >35 dB, a sensitivity of <-50 dB, and a resolution of 15 mm. To demonstrate the potential of the method, we measured the thickness of single-mode fiber cladding to be 19 microm.

PMID:
19881766
[PubMed]
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