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Microsc Microanal. 2006 Dec;12(6):506-14.

SESAM: exploring the frontiers of electron microscopy.

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  • 1Max Planck Institut für Metallforschung, Heisenbergstr. 3, D-70569 Stuttgart, Germany.


We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 ev = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.

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