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Opt Lett. 2009 Oct 1;34(19):3038-40. doi: 10.1364/OL.34.003038.

Focusing properties of hard x-ray photon sieves: three-parameter apodization window and waveguide effect.

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  • 1Key Laboratory of Nano-Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China. xiechangqing@ime.ac.cn


In this Letter, a three-parameter modified Kaiser apodization window is used to modulate the pinhole density on each ring of hard x-ray photon sieves, analyzing the guided-wave propagation inside the photon sieves' nanostructure. Theoretical analysis reveals that the waveguide effect can suppress the emergence of the high-order diffraction effect; the additional parameter of the modified Kaiser window function gives rise to new degrees of freedom for manipulating the FWHM and signal-to-noise ratio. Metal nanostructure thickness has no influence on the FWHM. Hard x-ray photon sieves with 90 degrees phase shift (not 180 degrees phase shift) can provide the best signal-to-noise ratio, which relaxes the nanofabrication constraints somewhat. Our work provides a robust way to design hard x-ray photon sieves.

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