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Appl Opt. 2008 Jun 1;47(16):3023-6.

Continuous wave terahertz spectrometer as a noncontact thickness measuring device.

Author information

  • 1Institute for High-Frequency Technology, Schleinitzstrasse, Braunschweig, Germany. r.wilk@menlosystems.com

Abstract

We present a low cost terahertz (THz) spectrometer with coherent detection based on two simple and robust dipole antennas driven by two laser diodes. The spectrometer covers frequencies up to 1 THz, with a peak signal-to-noise ratio exceeding 40 dB for a lock-in integration time of 30 ms. We demonstrate that the thickness profile of a sample can be reconstructed from an acquired THz image.

PMID:
18516122
[PubMed - indexed for MEDLINE]
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