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Appl Opt. 2000 Oct 1;39(28):5138-41.

Multiplicative electronic speckle-pattern interferometry fringes.

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  • 1Centro de Investigaciones en Optica, Apartado Postal 1-948, León, Guanajuato, Mexico. alon@foton.cio.mx


A theoretical analysis of fringe patterns and its experimental corroboration obtained by multiplication of two speckled images with electronic speckle-pattern interferometry (ESPI) are reported. A specifically designed digital filter is used to enhance the contrast and visibility of the inherently noisy multiplication fringes. Phase retrieval is achieved by a phase-stepping technique. Experimental results are presented for the in-plane-sensitive optical ESPI setup; however, out-of-plane and shearing setups may be used as well. The method represents an alternative to the subtraction and addition techniques in ESPI.

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