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J Neurosci. 2008 Mar 19;28(12):2959-64. doi: 10.1523/JNEUROSCI.3189-07.2008.

Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling.

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  • 1Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Federale de Lausanne, 1015 Lausanne, Switzerland. Graham.Knott@effl.ch
PMID:
18353998
[PubMed - indexed for MEDLINE]
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