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Appl Opt. 1998 Oct 1;37(28):6764-70.

Single-shot depth-section imaging through chromatic slit-scan confocal microscopy.


A chromatic confocal microscope constructed with a white-light source in combination with a diffractive lens provides wavelength-to-depth coding for profile measurements of a three-dimensional sample. We acquired depth-section images nonmechanically and in parallel by incorporating a slit-scan confocal technique into the system. A system using a 100x objective obtained a depth resolution of 0.023 mum comparable with surface profilometers that operate using conventional confocal microscopy. Experimental measurements of a four-phase-level diffractive element and of a machined, metal bearing are presented.

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