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Rev Sci Instrum. 2007 Nov;78(11):113701.

Shear force control for a terahertz near field microscope.

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  • 1Photonics and Optoelectronics Group, University of Munich, Amalienstr. 54, 80799 Munich, Germany.


We report on the advancement of apertureless terahertz microscopy by active shear force control of the scanning probe. Extreme subwavelength spatial resolution and a maximized image contrast are achieved by maintaining a tip-surface distance of about 20 nm. The constant distance between scanning tip and surface results in terahertz images that mirror the dielectric permittivity of the surface.

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