Display Settings:

Format

Send to:

Choose Destination
We are sorry, but NCBI web applications do not support your browser and may not function properly. More information
    Rev Sci Instrum. 2007 Nov;78(11):113701.

    Shear force control for a terahertz near field microscope.

    Source

    Photonics and Optoelectronics Group, University of Munich, Amalienstr. 54, 80799 Munich, Germany.

    Abstract

    We report on the advancement of apertureless terahertz microscopy by active shear force control of the scanning probe. Extreme subwavelength spatial resolution and a maximized image contrast are achieved by maintaining a tip-surface distance of about 20 nm. The constant distance between scanning tip and surface results in terahertz images that mirror the dielectric permittivity of the surface.

    PMID:
    18052474
    [PubMed - indexed for MEDLINE]

      Supplemental Content

      Icon for American Institute of Physics

      Save items

      Recent activity

      Your browsing activity is empty.

      Activity recording is turned off.

      Turn recording back on

      See more...
      Write to the Help Desk