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Opt Lett. 2007 Sep 1;32(17):2602-4.

Effects produced by metal-coated near-field probes on the performance of silicon waveguides and resonators.

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  • 1Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Drive, La Jolla, California 92093-0407, USA. mabashin@emerald.ucsd.edu

Abstract

We study the effects of metal-coated fiber near-field probes on the performance of nanophotonic devices. Employing a heterodyne near-field scanning optical microscope and analyzing transmission characteristics, we find that a metal-coated probe can typically introduce a 3 dB intensity loss and a 0.2 rad phase shift during characterization of a straight waveguide made in a silicon-on-insulator system. In resonant nanophotonic structures such as a 5 mum radius microring resonator, we demonstrate that the probe induces a 1 nm shift in resonant wavelength and decreases the resonator quality factor, Q, from 1100 to 480.

PMID:
17767319
[PubMed]
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