*A*, whole-cell voltage-clamp recording from a CA1 PC (*V*_{h}=−70 mV). Left inset: higher magnification of a 1 s segment denoted by dashed lines. Right inset: single sIPSC (indicated by asterisks) overlaid from an actual experiment and from a simulation using the parameters obtained from the actual recording. *B*, a simulated 15 s trace using the parameters obtained from the recording in *A*. Inset: higher magnification of a 1 s segment marked by dashed lines. *C*, distribution of interevent intervals (corresponding to the frequency of 27.2 Hz of the events in *A*) used to generate the trace in *B*. *D*, plot of phasic *I*_{mean} (P-*I*_{mean}) cumulative average (calculated every second) showing no difference between experiment and simulation. *E*, peak, 10–90% rise time and τ_{w} distributions used to generate the trace in *B*, which were obtained by using in the simulation the mean and standard deviations of the respective parameters from the recording in *A*. *F*, average simulated sIPSC showing the difference when the peak and τ_{w} are both increased by 15% and 10%, respectively (grey line). *G*, when peak amplitude and τ_{w} are compared between two sets of simulations, they do not show statistical differences (peak: *P* = 0.174, *n* = 7; τ_{w}: *P* = 0.064, *n* = 7, unpaired *t* tests). The combined effect of the simultaneous, albeit non-significant, changes in the two parameters results in a significantly different phasic *I*_{mean}(from −8.08 ± 0.53 to −10.0 ± 0.60 pA, *n* = 7, *P* = 0.031, unpaired *t* test).

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