Shown, is an overview of feature detection and matching. Panel A is a view of a grid square at 0° tilt. The border of a region (in this case a hole in the carbon) found using MSER is shown in red, and around it, in green, is the ellipse that has been fitted to the border (the ellipse radii are multiplied by 2). In the blue inset is the normalized feature (using the fitted ellipse parameters), on the left, and its derivative image, on the right. The green graph, superimposed in the panel, represents the PCA-SIFT descriptor for this feature, and is composed of the 36 principal components derived from the derivative image. Panel B shows two features found in an image of the same grid square tilted to 55°. Of note is that the fitted ellipses are now eccentric, and when normalized, the features become circular. This illustrates the reason why the MSER detector is affine invariant. The PCA-SIFT descriptors for two features in Panel B are also shown, and as expected, the feature that corresponds to the one in panel A has a very similar descriptor, while the other does not. The fact that the descriptors do not match perfectly has several potential sources, i.e. noise, detector instability, and the fact that an EM image is created by projection rather than reflection. Reasonable differences between correctly matched descriptors are fairly common in feature tracking, where the most important criterion is generally not how perfect a correct match is, but how well it compares to all the incorrect matches.