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Opt Lett. 2006 Feb 15;31(4):477-9.

Single-exposure optical sectioning by color structured illumination microscopy.

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  • 1Department of Physics, University of South Florida, Tampa, Florida 33620, USA.


Structured illumination microscopy (SIM) is a wide-field technique that rivals confocal microscopy in optical sectioning ability at a small fraction of the acquisition time. For standard detectors such as a CCD camera, SIM requires a minimum of three sequential frame captures, limiting its usefulness to static objects. By using a color grid and camera, we surpass this limit and achieve optical sectioning with just a single image acquisition. The extended method is now applicable to moving objects and improves the speed of three-dimensional imaging of static objects by at least a factor of three.

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