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Appl Opt. 2005 Jul 1;44(19):3945-53.

Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry.

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  • 1Wolfson School of Mechanical and Manufacturing Engineering, Loughborough University, Ashby Road, Loughborough, Leicestershire LE11 3TU, UK.


We show, for the first time to our knowledge, how wavelength-scanning interferometry can be used to measure depth-resolved displacement fields through semitransparent scattering surfaces. Temporal sequences of speckle interferograms are recorded while the wavelength of the laser is tuned at a constant rate. Fourier transformation of the resultant three-dimensional (3-D) intensity distribution along the time axis reconstructs the scattering potential within the medium, and changes in the 3-D phase distribution measured between two separate scans provide the out-of-plane component of the 3-D displacement field. The principle of the technique is explained in detail and illustrated with a proof-of-principle experiment involving two independently tilted semitransparent scattering surfaces. Results are validated by standard two-beam electronic speckle pattern interferometry.

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