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Appl Opt. 2005 Mar 20;44(9):1559-71.

Multiple-wave lateral shearing interferometry for wave-front sensing.

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  • 1Centre National de la Recherche Scientifique, Comissariat a l'Energie Atomique, Ecole, Polytechnique-Universite Paris VI, Ecole Polytechnique, 91128 Palaiseau Cedex, France. jean-christophe.chanteloup@polytechnique.fr

Abstract

Multiple-wave achromatic interferometric techniques are used to measure, with high accuracy and high transverse resolution, wave fronts of polychromatic light sources. The wave fronts to be measured are replicated by a diffraction grating into several copies interfering together, leading to an interference pattern. A CCD detector located in the vicinity of the grating records this interference pattern. Some of these wave-front sensors are able to resolve wave-front spatial frequencies 3 to 4 times higher than a conventional Shack-Hartmann technique using an equivalent CCD detector. Its dynamic is also much higher, 2 to 3 orders of magnitude.

PMID:
15818859
[PubMed]
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