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Opt Lett. 2003 Nov 15;28(22):2147-9.

Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling.

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  • 1Laboratoire de Nanotechnologie et d'Instrumentation Optique--Centre National de la Recherche Scientifique Formation de Recherche en Evolution 2671, 12 Rue Marie Curie BP-2060, 10010 Troyes Cedex, France.


In apertureless scanning near-field optical microscopy (ASNOM), the probe vibration is often used to increase the detected signal. The useful signal is detected at the probe-vibration frequency by a lock-in amplifier. By comparing two-dimensional numerical results with an experimental scan, we show numerically that, to explain or predict the detected signal, a realistic model of ASNOM should take into account the scan of the probe as well as the probe vibration and the material properties.

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