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Institute of Imaging and Applied Optics, Swiss Federal Institute of Technology, CH-1015 Lausanne, Switzerland. jelena.mitic@epfl.ch
Optical sectioning in wide-field microscopy is achieved by illumination of the object with a continuously moving single-spatial-frequency pattern and detecting the image with a smart pixel detector array. This detector performs an on-chip electronic signal processing that extracts the optically sectioned image. The optically sectioned image is directly observed in real time without any additional postprocessing.
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