Theory of the steady-state-photocarrier-grating technique for obtaining accurate diffusion-length measurements in amorphous silicon
Phys Rev B Condens Matter
.
1992 Jan 15;45(3):1126-1138.
doi: 10.1103/physrevb.45.1126.
Authors
K Hattori
,
H Okamoto
,
Y Hamakawa
PMID:
10001586
DOI:
10.1103/physrevb.45.1126
No abstract available