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Results: 6

1.
Figure 6

Figure 6. From: Identification of Pathways Controlling DNA Damage Induced Mutation In Saccharomyces cerevisiae.

Model of induced mutation. The X in the template represents a lesion and the box in the newly synthesized DNA represents a mutation. See discussion for details.

Ewa T. Lis, et al. DNA Repair (Amst). ;7(5):801-810.
2.
Figure 2

Figure 2. From: Identification of Pathways Controlling DNA Damage Induced Mutation In Saccharomyces cerevisiae.

UV-induced Canr mutation spectra. Mutation spectra of canavanine resistant clones were determined by DNA sequencing of the CAN1 gene amplified from mutant colonies obtained after irradiation of cells with 36 J/m2 UV-light.

Ewa T. Lis, et al. DNA Repair (Amst). ;7(5):801-810.
3.
Figure 4

Figure 4. From: Identification of Pathways Controlling DNA Damage Induced Mutation In Saccharomyces cerevisiae.

Cellular levels of each dNTP before and after treatment with UV-light in the presence or absence of RNR4. Cells from exponential cultures were treated with 30J/m2 UV-light and allowed to grow for 2 hours. Cells were then harvested and the dNTP levels determined as described previously [16].

Ewa T. Lis, et al. DNA Repair (Amst). ;7(5):801-810.
4.
Figure 1

Figure 1. From: Identification of Pathways Controlling DNA Damage Induced Mutation In Saccharomyces cerevisiae.

Mutation epistasis analysis. (A–I) UV-induced mutation frequencies were determined as described in Materials and Methods. (J–L) EMS-induced mutation frequencies. Frequencies were determined using a method analogous to that for UV-induced mutation frequencies, but with EMS present in SC-Arg plates. Characterization of induced mutation frequencies was performed in strain RDKY3615 for Fig.1 A–F, J and in strain S18-1 for Fig.1 G-I, K, L.

Ewa T. Lis, et al. DNA Repair (Amst). ;7(5):801-810.
5.
Figure 3

Figure 3. From: Identification of Pathways Controlling DNA Damage Induced Mutation In Saccharomyces cerevisiae.

RAD18 genetic interactions with RNR4, POL2 and POL3. Cultures were grown to mid-log phase, and normalized by cell density. 5 µL drops of five-fold serial dilutions were plated on YPD, YPD subsequently irradiated with (A) 17 J/m2 of UV light, and YPD containing 0.0002%MMS or 0.005%EMS; or (B) 25 J/m2 of UV light, and YPD containing 0.0008%MMS or 0.01%EMS. Plates were grown for 3 days at 30°C, and then photographed.

Ewa T. Lis, et al. DNA Repair (Amst). ;7(5):801-810.
6.
Figure 5

Figure 5. From: Identification of Pathways Controlling DNA Damage Induced Mutation In Saccharomyces cerevisiae.

Inhibition of UV-induced mutation with HU as measured by CAN1 and lys2ΔBgl assays. (A) To determine the number of mutants, cells from saturated cultures were plated on SC-Arg media containing both canavanine and different concentrations of HU and immediately irradiated with 67 J/m2 of UV light. To determine the number of viable cells, cells were plated on SC-Arg media containing HU and immediately irradiated with 67 J/m2 of UV light. Induced mutation frequencies were determined by dividing the number of Canr mutants observed by the number of viable cells. (B) Inhibition of UV-induced mutation at CAN1 by HU. Deletion of RAD53 requires deletion of SML1. The sml1Δ mutant was examined as a control for the sml1Δ rad53Δ double mutant. Mutation frequencies were determined as described above.

Ewa T. Lis, et al. DNA Repair (Amst). ;7(5):801-810.

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